Ultrasound applications typically require measurements covering a very low frequency range (1-10 MHz). Andrew Betts, a Test Engineer for Butterfly, was struggling to find an effective 10 MHz VNA solution in his desired price range. Other VNA units he had used did not cover these frequencies or were very expensive and left him underwhelmed by the user experience and difficulty of programming. This prompted Andrew to pursue a PXI based solution with fast test times to be used with his PXI based ATE semiconductor tester. “We’re taking hundreds and hundreds of S parameter frequency sweeps per device to measure performance characteristics of capacitor-like components,” explained Betts. “Test time is crucial in the production environment, especially when it can be coupled with good application support. 1 second sweep times have been reduced to 300 µs using the PXIe-S5090.”
Andrew had experience with National Instruments’ (NI) PXI based offerings and decided to begin his search by reaching out to them. NI recommended CMT’s PXIe-S5090 Analyzer, which at the time was in its final stage of production. He was quickly persuaded, as the PXIe-S5090 was able to cover his desired frequency range and he was comforted by the fact it had been referred to him by a reputable source. Betts knowledge of NI’s PXI system for production/semiconductor testing meant he was no stranger to their equipment and made the PXIe-S5090 a convenient solution for him to implement, installing it directly into his NI STS tester system.